TEST REPORT Reference No. ................... : WTH22X12242882W001 FCC ID ................................ :
2AP35-SR07PM04H41 Applicant ........................... :
INTERNATIONAL DEVELOPMENT COMPANY Address.............................. :
899 Henrietta Creek Road,Roanoke, Texas 76262 USA. Manufacturer ..................... :
Zhongshan Quanxin Lighting & Electrical Corp., Ltd. Address.............................. :
Zone A, Building 1, No.1, Hongji Road, West District, Zhongshan City, Guangdong Province Product Name ................... : Solar LED Light Model No... ........................ : SR07PM04H-41 Standards .......................... :
FCC Part 15.249 Date of Receipt sample .... :
2022-12-02 Date of Test........................ :
2022-12-02 to 2022-12-12 Date of Issue ..................... :
2022-12-12 Test Report Form No. ...... : WTX_Part 15_249W Test Result ......................... : Pass Remarks:
The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of approver. Prepared By:
Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China Tel.: +86-755-33663308 Fax.: +86-755-33663309 Email: sem@waltek.com.cn Tested by:
Approved by:
Mike Shi Silin Chen Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 1 of 29 Reference No.: WTH22X12242882W TABLE OF CONTENTS 1. GENERAL INFORMATION ....................................................................................................................................4 1.1 PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) .........................................................................4 1.2 TEST STANDARDS .................................................................................................................................................5 1.3 TEST METHODOLOGY ...........................................................................................................................................5 1.4 TEST FACILITY ......................................................................................................................................................5 1.5 EUT SETUP AND TEST MODE ..............................................................................................................................6 1.6 MEASUREMENT UNCERTAINTY .............................................................................................................................7 1.7 TEST EQUIPMENT LIST AND DETAILS ...................................................................................................................8 2. SUMMARY OF TEST RESULTS ......................................................................................................................... 11 3. ANTENNA REQUIREMENTS .............................................................................................................................. 12 3.1 STANDARD APPLICABLE ..................................................................................................................................... 12 3.2 TEST RESULT ...................................................................................................................................................... 12 4. RADIATED EMISSIONS ....................................................................................................................................... 13 4.1 STANDARD APPLICABLE ..................................................................................................................................... 13 4.2 TEST PROCEDURE .............................................................................................................................................. 13 4.3 CORRECTED AMPLITUDE & MARGIN CALCULATION ........................................................................................... 16 4.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 16 5. OUT OF BAND EMISSIONS ................................................................................................................................ 21 5.1 STANDARD APPLICABLE ..................................................................................................................................... 21 5.2 TEST PROCEDURE .............................................................................................................................................. 21 5.3 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 21 6. EMISSION BANDWIDTH ...................................................................................................................................... 26 6.1 STANDARD APPLICABLE ..................................................................................................................................... 26 6.2 TEST PROCEDURE .............................................................................................................................................. 26 6.3 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 26 7. CONDUCTED EMISSIONS .................................................................................................................................. 28 7.1 TEST PROCEDURE .............................................................................................................................................. 28 7.2 BASIC TEST SETUP BLOCK DIAGRAM ................................................................................................................ 28 7.3 TEST RECEIVER SETUP ...................................................................................................................................... 28 7.4 SUMMARY OF TEST RESULTS/PLOTS ................................................................................................................. 28 APPENDIX PHOTOGRAPHS ................................................................................................................................... 29 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 2 of 29 Reference No.: WTH22X12242882W Report version Version No. Date of issue Rev.00 2022-12-12
Description Original
Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 3 of 29 Reference No.: WTH22X12242882W 1. GENERAL INFORMATION 1.1 Product Description for Equipment Under Test (EUT) Client Information Manufacturer 2#:
Solana Smart Lighting Co., Ltd. Address of Manufacturer 2#:
No.268 Moo 7, Huasamrong Sub-district, Plaengyao District, Chachoengsao Province, Thailand 24190 General Description of EUT Product Name:
Trade Name:
Model No.:
Solar LED Light
SR07PM04H-41 Adding Model(s):
commercial purpose; Where * is used to denote letters or blank for SR07P*##*-## Where "#" is used to denote numbers or blank for Rated Voltage:
Battery Capacity Power Adapter Model:
commercial purpose. Battery:DC3.7V 800mAh
Note: The test data is gathered from a production sample, provided by the manufacturer. The appearance of others models listed in the report is different from main-test model SR07PM04H-41, but the circuit and the electronic construction do not change, declared by the manufacturer. Technical Characteristics of EUT Frequency Range:
Max. Field Strength:
Modulation:
Quantity of Channels:
Antenna Type:
Antenna Gain:
2420MHz-2470MHz 85.10dBuV/m GFSK 3 Integral Antenna 0dBi Note: The Antenna Gain is provided by the customer and can affect the validity of results. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 4 of 29 Reference No.: WTH22X12242882W 1.2 Test Standards The tests were performed according to following standards:
FCC Rules Part 15.249: Operation within the bands 902-928MHz, 2400-2483.5MHz, 5725-5875MHz, and 24.0-24.25GHz. ANSI C63.10-2013: American National Standard for Testing Unlicensed Wireless Devices. Maintenance of compliance is the responsibility of the manufacturer. Any modification of the product, which results in lowering the emission, should be checked to ensure compliance has been maintained. 1.3 Test Methodology All measurements contained in this report were conducted with ANSI C63.10-2013, The equipment under test (EUT) was configured to measure its highest possible emission level. The test modes were adapted accordingly in reference to the Operating Instructions. 1.4 Test Facility Address of the test laboratory Laboratory: Waltek Testing Group (Shenzhen) Co., Ltd. Address: 1/F., Room 101, Building 1, Hongwei Industrial Park, Liuxian 2nd Road, Block 70 Bao'an District, Shenzhen, Guangdong, China FCC Registration No.: 125990 Waltek Testing Group (Shenzhen) Co., Ltd. EMC Laboratory has been registered and fully described in a report filed with the FCC (Federal Communications Commission). The acceptance letter from the FCC is mai ntained in our files. The Designation Number is CN5010, and Test Firm Registration Number is 125990. Industry Canada (IC) Registration No.: 11464A The 3m Semi-anechoic chamber of Waltek Testing Group (Shenzhen) Co., Ltd. has been registered by Certification and Engineering Bureau of Industry Canada for radio equipment testing with Registration No.:
11464A and the CAB identifier is CN0057. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 5 of 29 Reference No.: WTH22X12242882W 1.5 EUT Setup and Test Mode The EUT was operated in the engineering mode to fix the Tx frequency that was for the purpose of the measurements. All testing shall be performed under maximum output power condition, and to measure its highest possible emissions level, more detailed description as follows:
Test Mode List Test Mode TM1 TM2 TM3 Test Conditions Description Low Channel Middle Channel High Channel Temperature:
Relative Humidity:
ATM Pressure:
EUT Cable List and Details Remark 2420MHz 2450MHz 2470MHz 22~25 C 50~55 %. 1019 mbar Cable Description Length (m) Shielded/Unshielded With / Without Ferrite
Special Cable List and Details Cable Description Length (m) Shielded/Unshielded With / Without Ferrite
Auxiliary Equipment List and Details Description Manufacturer
Model
Serial Number
Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 6 of 29 Reference No.: WTH22X12242882W 1.6 Measurement Uncertainty Measurement uncertainty Parameter RF Output Power Occupied Bandwidth Conducted Spurious Emission Conducted Emissions Conditions Conducted Conducted Conducted Conducted Transmitter Spurious Emissions Radiated Uncertainty 0.42dB 1.5%
2.17dB 9-150kHz 3.74dB 0.15-30MHz 3.34dB 30-200MHz 4.52dB 0.2-1GHz 5.56dB 1-6GHz 3.84dB 6-26GHz 3.92dB Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 7 of 29 Reference No.: WTH22X12242882W 1.7 Test Equipment List and Details No. Description Manufacturer Model Serial No. Cal Date Due. Date Communication Rohde &
SEMT-1075 Tester SEMT-1063 GSM Tester SEMT-1072 SEMT-1079 SMET-1313 SEMT-1080 Spectrum Analyzer Spectrum Analyzer Spectrum Analyzer Signal Generator SEMT-1081 Vector Signal Generator Schwarz Rohde &
Schwarz CMW500 148650 2022-03-22 2023-03-21 CMU200 114403 2022-03-22 2023-03-21 Agilent E4407B Agilent N9020A Agilent N9020A Agilent 83752A Agilent N5182A MY414404 00 US471401 02 MY543205 48 3610A014 53 MY470702 02 2022-03-25 2023-03-24 2022-03-22 2023-03-21 2022-03-22 2023-03-21 2022-03-22 2023-03-21 2022-03-22 2023-03-21 SEMT-1028 Power Divider Weinschel 1506A PM204 2022-03-22 2023-03-21 SEMT-1082 Power Divider RF-Lambda RFLT4W5M18 14110400 G 027 2022-03-22 2023-03-21 SEMT-C001 Cable Zheng DI SEMT-C002 Cable Zheng DI SEMT-C003 Cable Zheng DI SEMT-C004 SEMT-C005 SEMT-C006 Cable Cable Cable Chamber A: Below 1GHz SEMT-1031 SEMT-1007 Spectrum Analyzer EMI Test Receiver Zheng DI Zheng DI Zheng DI Rohde &
Schwarz Rohde &
Schwarz LL142-07-07-1 0M(A) ZT40-2.92J-2.9 2J-6M ZT40-2.92J-2.9 2J-2.5M 2M0RFC 1M0RFC 1M0RFC FSP30 ESVB SEMT-1008 Amplifier Agilent 8447F
836079/03 5 825471/00 5 3113A067 17 2022-03-22 2023-03-21 2022-03-22 2023-03-21 2022-01-07 2023-01-06 SEMT-1069 Loop Antenna Schwarz beck FMZB 1516 9773 2021-03-20 2023-03-19 SEMT-1068 Broadband Antenna Chamber A: Above 1GHz Schwarz beck VULB9163 9163-333 2021-03-20 2023-03-19 SEMT-1031 Spectrum Analyzer Rohde &
Schwarz FSP30 836079/03 5 2022-03-22 2023-03-21 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 8 of 29 Reference No.: WTH22X12242882W SEMT-1007 EMI Test Receiver SEMT-1043 Amplifier SEMT-1042 Horn Antenna Rohde &
Schwarz C&D ETS ESVB 825471/00 5 2022-03-22 2023-03-21 PAP-1G18 2002 2022-03-22 2023-03-21 3117 00086197 2021-03-19 2023-03-18 SEMT-1121 Horn Antenna Schwarzbeck BBHA 9170 BBHA917 0582 2021-04-27 2023-04-26 SEMT-1216 Pre-amplifier Schwarzbeck BBV 9721 9721-031 2022-03-25 2023-03-24 SEMT-1163 Spectrum Analyzer Rohde &
Schwarz Chamber B:Below 1GHz Trilog FSP40 100612 2022-03-22 2023-03-21 SEMT-1068 Broadband Schwarz beck VULB9163(B) 9163-635 2021-04-09 2023-04-08 Antenna SEMT-1067 Amplifier Agilent 8447D 2944A101 79 2022-03-22 2023-03-21 SEMT-1066 EMI Test Receiver Chamber C:Below 1GHz SEMT-1319 EMI Test Receiver Trilog Rohde &
Schwarz Rohde &
Schwarz ESPI 101391 2022-03-22 2023-03-21 ESIB 26 100401 2022-01-07 2023-01-06 SEMT-1343 Broadband Schwarz beck VULB 9168 1194 2021-05-28 2023-05-27 Antenna SEMT-1333 Amplifier HP 8447F 2944A038 69 2022-03-22 2023-03-21 Conducted Room 1#
SEMT-1001 EMI Test Receiver SEMT-1002 Pulse Limiter Rohde &
Schwarz Rohde &
Schwarz ESPI 101611 2022-03-21 2023-03-20 ESH3-Z2 100911 2022-03-25 2023-03-24 SEMT-1003 AC LISN Schwarz beck NSLK8126 8126-224 2022-03-22 2023-03-21 Conducted Room 2#
SEMT-1334 EMI Test Receiver SEMT-1336 LISN Rohde &
Schwarz Rohde &
Schwarz ESPI 101259 2022-03-22 2023-03-21 ENV 216 100097 2022-03-22 2023-03-21 Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 9 of 29 Reference No.: WTH22X12242882W Description Manufacturer Software List EMI Test Software
(Radiated Emission)*
EMI Test Software
(Conducted Emission)*
Farad Farad Model EZ-EMC Version RA-03A1 EZ-EMC RA-03A1
*Remark: indicates software version used in the compliance certification testing. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 10 of 29 Reference No.: WTH22X12242882W 2. SUMMARY OF TEST RESULTS FCC Rules 15.203 15.205 15.207(a) 15.209(a)(f) 15.249(a) 15.249(d) 15.215(c) N/A: Not applicable. Description of Test Item Antenna Requirement Restricted Band of Operation Conducted Emission Radiated Spurious Emissions Field Strength of Emissions Out of Band Emission Emission Bandwidth Result Compliant Compliant Compliant Compliant Compliant Compliant Compliant Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 11 of 29 Reference No.: WTH22X12242882W 3. Antenna Requirements 3.1 Standard Applicable According to FCC Part 15.203, an intentional radiator shall be designed to ensure that no antenna other than that furnished by the responsible party shall be used with the device. The use of a permanently attached antenna or of an antenna that uses a unique coupling to the intentional radiator shall be considered sufficient to comply with the provisions of this section. 3.2 Test Result This product has an Integral Antenna, fulfill the requirement of this section. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 12 of 29 Reference No.: WTH22X12242882W 4. Radiated Emissions 4.1 Standard Applicable According to 15.249(a), the field strength of emissions from intentional radiators operated within these frequency bands shall comply with the following:
Fundamental Frequency Field strength of fundamental Field strength of Harmonics
(milli-volts/meter)
(micro-volts/meter) 902-928MHz 2400-2483.5MHz 5725-5875MHz 24.0-24.25GHz 50 50 50 250 500 500 500 2500
(d) Emissions radiated outside of the specified frequency bands, except for harmonics, shall be attenuated by at least 50dB below the level of the fundamental or to the general radiated emission limits in 15.209, whichever is the lesser attenuation. The emission limit in this paragraph is based on measurement instrumentation employing an average detector. The provisions in 15.35 for limiting peak emissions apply. Spurious Radiated Emissions measurements starting below or at the lowest crystal frequency. 4.2 Test Procedure The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.205 15.249(a) and FCC Part 15.209 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 13 of 29 Reference No.: WTH22X12242882W The test setup for emission measurement below 30MHz. Semi-anechoic 3m Chamber Turn Table From 0to 360 EUT 3m 0.8m Turn Table PC System Spectrum Analyzer AMP Combining Network The test setup for emission measurement from 30MHz to 1GHz. Semi-anechoic 3m Chamber Antenna Elevation Varies From 1 to 4m Turn Table From 0to 360 3m EUT 0.8m Turn Table PC System Spectrum Analyzer AMP Combining Network Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 14 of 29 Reference No.: WTH22X12242882W The test setup for emission measurement above 1GHz. Anechoic 3m Chamber Antenna Elevation Varies From 1 to 4m Turn Table From 0to 360 EUT 3m 1.5m Turn Table Absorbers PC System Spectrum Analyzer AMP Combining Network Frequency :9kHz-30MHz Frequency :30MHz-1GHz Frequency :Above 1GHz RBW=10KHz, RBW=120KHz, RBW=1MHz, VBW =30KHz VBW=300KHz VBW=3MHz(Peak), 10Hz(AV) Sweep time= Auto Sweep time= Auto Sweep time= Auto Trace = max hold Trace = max hold Trace = max hold Detector function = peak Detector function = peak, QP Detector function = peak, AV Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 15 of 29 Reference No.: WTH22X12242882W 4.3 Corrected Amplitude & Margin Calculation The Corrected Amplitude is calculated by adding the Antenna Factor and the Cable Factor, and subtracting the Amplifier Gain from the Amplitude reading. The basic equation is as follows:
Corr. Ampl. = Indicated Reading + Ant. Factor + Cable Loss Ampl. Gain The Margin column of the following data tables indicates the degree of compliance with the applicable limit. For example, a margin of -6dBV means the emission is 6dBV below the maximum limit. The equation for margin calculation is as follows:
Margin = Corr. Ampl. FCC Part 15C Limit 4.4 Summary of Test Results/Plots Note: this EUT was tested in 3 orthogonal positions and the worst case position data was reported. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 16 of 29 Reference No.: WTH22X12242882W Spurious Emissions Below 1GHz Test Channel Low(worst case) Polarity:
Horizontal No. Frequency Reading Correct Result Limit Margin Degree Height Remark
(MHz)
(dBuV/m) dB/m
(dBuV/m)
(dBuV/m)
(dB)
(cm) 1 2 3 4 5 6 50.9420 103.8055 128.1130 281.9946 451.1350 909.6667 27.62 28.50 29.41 27.94 27.87 28.15
-7.48
-8.09
-10.27
-5.61
-2.76 4.05 20.14 20.41 19.14 22.33 25.11 32.20 40.00 43.50 43.50 46.00 46.00 46.00
-19.86
-23.09
-24.36
-23.67
-20.89
-13.80
peak peak peak peak peak peak Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 17 of 29 Reference No.: WTH22X12242882W Test Channel Low(worst case) Polarity:
Vertical No. Frequency Reading Correct Result Limit Margin Degree Height Remark
(MHz)
(dBuV/m) dB/m
(dBuV/m)
(dBuV/m)
(dB)
(cm) 1 2 3 4 5 6 42.3022 60.2801 99.5281 282.9852 560.6928 716.6820 28.48 26.82 28.55 27.89 27.02 27.41
-7.16
-9.11
-8.18
-5.59
-0.90 1.52 21.32 17.71 20.37 22.30 26.12 28.93 40.00 40.00 43.50 46.00 46.00 46.00
-18.68
-22.29
-23.13
-23.70
-19.88
-17.07
peak peak peak peak peak peak Remark: -Means the test Degree and Height are not recorded by the test software and only show the worst case in the test report. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 18 of 29 Reference No.: WTH22X12242882W Spurious Emissions Above 1GHz Frequency Reading Correct Result Limit Margin
(MHz)
(dBuV/m) dB/m
(dBuV/m)
(dBuV/m)
(dB) Polar H/V Detector Low Channel-2420MHz 2420 2420 4840 4840 7260 7260 2420 2420 4840 4840 7260 7260 2450 2450 4900 4900 7350 2450 2450 4900 4900 7350 7320 7320 93.48 92.42 46.88 38.52 47.66 39.59 87.37 85.32 48.86 35.18 49.51 38.42 91.38 89.28 49.03 39.65 48.80 41.11 87.54 84.80 48.79 35.37 49.43 40.06
-8.38
-8.38
-2.83
-2.83 2.81 2.81
-8.38
-8.38
-2.83
-2.83 2.81 2.81
-8.27
-8.27
-2.65
-2.65 3.15 3.15
-8.27
-8.27
-2.65
-2.65 3.15 3.15 85.10 84.04 44.05 35.69 50.47 42.40 78.99 76.94 46.03 32.35 52.32 41.23 114 94 74 54 74 54 114 94 74 54 74 54 Middle Channel-2450MHz 83.11 81.01 46.38 37.00 51.95 44.26 79.27 76.53 46.14 32.72 52.58 43.21 114 94 74 54 74 54 114 94 74 54 74 54
-28.90
-9.96
-29.95
-18.31
-23.53
-11.60
-35.01
-17.06
-27.97
-21.65
-21.68
-12.77
-30.89
-12.99
-27.62
-17.00
-22.05
-9.74
-34.73
-17.47
-27.86
-21.28
-21.42
-10.79 H H H H H H V V V V V V H H H H H H V V V V V V PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV PK AV Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 19 of 29 Reference No.: WTH22X12242882W Frequency Reading Correct Result Limit Margin
(MHz)
(dBuV/m) dB/m
(dBuV/m)
(dBuV/m)
(dB) Polar H/V Detector High Channel-2470MHz 2470 2470 4940 4940 7410 7410 2470 2470 4940 4940 7410 7410 90.74 88.93 47.73 41.05 48.84 42.38 87.02 82.98 49.14 34.78 50.96 39.19
-8.19
-8.19
-2.60
-2.60 3.44 3.44
-8.19
-8.19
-2.60
-2.60 3.44 3.44 82.55 80.74 45.13 38.45 52.28 45.82 78.83 74.79 46.54 32.18 54.40 42.63 114 94 74 54 74 54 114 94 74 54 74 54
-31.45
-13.26
-28.87
-15.55
-21.72
-8.18
-35.17
-19.21
-27.46
-21.82
-19.60
-11.37 H H H H H H V V V V V V PK AV PK AV PK AV PK AV PK AV PK AV Note: Testing is carried out with frequency rang 9kHz to the tenth harmonics, which above 5th Harmonics are attenuated more than 20dB below the permissible limits or the field strength is too small to be measured. The measurements greater than 20dB below the limit from 9kHz to 30MHz.. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 20 of 29 Reference No.: WTH22X12242882W 5. Out of Band Emissions 5.1 Standard Applicable Emissions radiated outside of the specified frequency bands, except for harmonics, shall be attenuated by at least 50dB below the level of the fundamental or to the general radiated emission limits in 15.209, whichever is the lesser attenuation. 5.2 Test Procedure As the radiation test, set the Lowest and Highest Transmitting Channel, observed the outside band of 2400MHz to 2483.5MHz, than mark the higher-level emission for comparing with the FCC rules. 5.3 Summary of Test Results/Plots Test mode Lowest Highest Frequency MHz 2310.00 2390.00 2400.00 2483.50 2500.00 Limit dBuV / dBc
<54dBuV
<54dBuV
<54dBuV
<54dBuV
<54dBuV Result Pass Pass Pass Pass Pass The edge emissions are below the FCC 15.209 Limits or complies with the 15.249 requirements. Please refer to the test plots as below. Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 21 of 29 Reference No.: WTH22X12242882W RBW: 1MHz; VBW: 3MHz Test Channel Low Polarity:
Horizontal (worst case) No. Frequency Reading Correct Result Limit Margin Remark
(MHz)
(dBuV/m) dB/m
(dBuV/m)
(dBuV/m)
(dB) 1 2 3 2310.000 2310.000 2390.000 2390.000 2419.920 2417.160 42.87 54.50 43.01 53.81 92.00 92.54
-8.78
-8.78
-8.48
-8.48
-8.38
-8.38 34.09 45.72 34.53 45.33 83.62 84.16 54.00 74.00 54.00 74.00
-19.91
-28.28
-19.47
-28.67
Ave Detector Peak Detector Ave Detector Peak Detector Ave Detector Peak Detector Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 22 of 29 Reference No.: WTH22X12242882W Test Channel High Polarity:
Horizontal (worst case) No. Frequency Reading Correct Result Limit Margin Remark
(MHz)
(dBuV/m) dB/m
(dBuV/m)
(dBuV/m)
(dB) 1 2 3 2469.920 2470.200 2483.500 2483.500 2500.000 2500.000 90.07 90.23 42.69 56.96 42.72 52.84
-8.19
-8.19
-8.14
-8.14
-8.08
-8.08 81.88 82.04 34.55 48.82 34.64 44.76
54.00 74.00 54.00 74.00
-19.45
-25.18
-19.36
-29.24 Ave Detector Peak Detector Ave Detector Peak Detector Ave Detector Peak Detector Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 23 of 29 Reference No.: WTH22X12242882W Band edge RBW: 100kHz; VBW: 300kHz Test Channel Low Polarity:
Horizontal(worst case) No. Frequency Reading Correct Result Limit Margin Remark
(MHz)
(dBuV/m) dB/m
(dBuV/m)
(dBuV/m)
(dB) 1 2400.000 47.72
-8.45 39.27 54.00
-14.73 Peak Detector Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 24 of 29 Reference No.: WTH22X12242882W Test Channel High Polarity:
Horizontal(worst case) No. Frequency Reading Correct Result Limit Margin Remark
(MHz)
(dBuV/m) dB/m
(dBuV/m)
(dBuV/m)
(dB) 1 2 3 2469.920 2483.500 2500.000 89.86 47.40 46.97
-8.19
-8.14
-8.08 81.67 39.26 38.89
54.00 54.00
-14.74
-15.11 Peak Detector Peak Detector Peak Detector Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 25 of 29 Reference No.: WTH22X12242882W 6. Emission Bandwidth 6.1 Standard Applicable According to 15.215(c), intentional radiators operating under the alternative provisions to the general emission limits, as contained in 15.217 through 15.257 and in Subpart E of this part, must be designed to ensure that the 20dB bandwidth of the emission, or whatever bandwidth may otherwise be specified in the specific rule section under which the equipment operates, is contained within the frequency band designated in the rule section under which the equipment is operated. The requirement to contain the designated bandwidth of the emission within the specified frequency band includes the effects from frequency sweeping, frequency hopping and other modulation techniques that may be employed as well as the frequency stability of the transmitter over expected variations in temperature and supply voltage. If a frequency stability is not specified in the regulations, it is recommended that the fundamental emission be kept within at least the central 80% of the permitted band in order to minimize the possibility of out-of-band operation. 6.2 Test Procedure According to the ANSI 63.10-2013, the emission bandwidth test method as follows. Remove the antenna from the EUT and then connect a low loss RF cable from the antenna port to the spectrum analyzer. Set span = 1MHz, centered on a transmitting channel RBW 1% 20dB Bandwidth, VBW RBW Sweep = auto Detector function = peak Trace = max hold All the trace to stabilize, use the marker-to-peak function to set the marker to the peak of the emission, use the marker-delta function to measure and record the 20dB down and 99% bandwidth of the emission. 6.3 Summary of Test Results/Plots Test Channel Low Channel Middle Channel High Channel 20dB Bandwidth(kHz) 8.32 6.96 4.92 Please refer to the following test plots:
Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 26 of 29 Reference No.: WTH22X12242882W Low Channel Middle Channel High Channel Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 27 of 29 Ref 20 dBmOffset 1 dB A LVL1 PKMAXHAtt 30 dB*2 MHz/Center2.42 GHzSpan20 MHz**3DBRBW 100 kHzVBW 300 kHzSWT 2.5 ms-80-70-60-50-40-30-20-10010201Marker 1 [T1 ] -20.29 dBm 2.414760000 GHz2Marker 2 [T1 ] 0.59 dBm 2.419960000 GHz1Delta 1 [T1 ] -0.87 dB 8.320000000 MHzD1 -19.51 dBmDate: 10.DEC.2022 15:57:47Ref 20 dBmOffset 1 dB A LVL1 PKMAXHAtt 30 dB*2 MHz/Center2.45 GHzSpan20 MHz**3DBRBW 100 kHzVBW 300 kHzSWT 2.5 ms-80-70-60-50-40-30-20-10010201Marker 1 [T1 ] -21.04 dBm 2.445520000 GHz2Marker 2 [T1 ] 0.26 dBm 2.449960000 GHz1Delta 1 [T1 ] 0.35 dB 6.960000000 MHzD1 -19.74 dBmDate: 10.DEC.2022 15:59:02Ref 20 dBmOffset 1 dB A LVL1 PKMAXHAtt 30 dB*2 MHz/Center2.47 GHzSpan20 MHz**3DBRBW 100 kHzVBW 300 kHzSWT 2.5 ms-80-70-60-50-40-30-20-10010201Marker 1 [T1 ] -20.74 dBm 2.466920000 GHz2Marker 2 [T1 ] -0.03 dBm 2.469920000 GHz1Delta 1 [T1 ] 0.04 dB 4.920000000 MHzD1 -20.03 dBmDate: 10.DEC.2022 16:00:08 Reference No.: WTH22X12242882W 7. Conducted Emissions 7.1 Test Procedure The setup of EUT is according with per ANSI C63.10-2013 measurement procedure. The specification used was with the FCC Part 15.207 Limit. The external I/O cables were draped along the test table and formed a bundle 30 to 40cm long in the middle. The spacing between the peripherals was 10cm. 7.2 Basic Test Setup Block Diagram 0.4m 0.8m LISN EUT Receiver PC System 0.8m
:50 Terminator 7.3 Test Receiver Setup During the conducted emission test, the test receiver was set with the following configurations:
Start Frequency ..................................................................... 150kHz Stop Frequency ..................................................................... 30MHz Sweep Speed ........................................................................ Auto IF Bandwidth .......................................................................... 10kHz Quasi-Peak Adapter Bandwidth ............................................ 9kHz Quasi-Peak Adapter Mode .................................................... Normal 7.4 Summary of Test Results/Plots Not applicable Waltek Testing Group (Shenzhen) Co., Ltd. Http://www.waltek.com.cn Page 28 of 29 Reference No.: WTH22X12242882W APPENDIX PHOTOGRAPHS Please refer to ANNEX
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